SEE/MAPLD 2018 Tutorials and Invited Talks
| Tutorials | ||
SEE Testing Tutorial: Planning and Execution Basics Ken LaBel & Jonny Pellish, NASA Goddard Space Flight Center FPGA Basics and FPGA SEE Testing Nadia Rezzak, Microsemi |
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| SEE Session Invited Talks | ||
The NSRL Facility Mike Sivertz, NSRL AE-9/AP-9 Environment Model Update Tim Guild, The Aerospace Corporation Model-Based Mission Assurance Brian Sierawski, Vanderbilt University |
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| Combined SEE/MAPLD Session Invited Talks | ||
New Developments in Error Detection and Correction Strategies for Critical Applications Melanie Berg, AS&D, Inc. / GSFC An Informal Introduction to Autonomous Driving Dr. Xiaodi Hou, Tu Simple |
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| MAPLD Session Invited Talks | ||
SER Qualification and Radiation Effects Implications for Functional Safety in Automotive Electronics Jyotika Athavale, Intel Corporation Radiation Qualification of Mass Produced Electronic Systems at CERN Slawosz Uznanski, CERN Information Leakage and Mitigations: from Smartcards to SoCs Ro Cammarota, Qualcomm Measuring Trust Jonathan Graf, Graf Research |
Technical Chair: SEE: Katherine Scott, The Boeing Company / MAPLD: Slawosz Uznanski, CERN
Poster Session Chair: Martha O'Bryan, AS&D, Inc. / NASA Goddard Space Flight Center
Industrial Exhibit Chairwoman: Teresa Farris, Cobham Semiconductor Solutions
Local Arrangements & Registration Services: Susan Hunt, STAMP Services
Website Curator: Carl Szabo, AS&D, Inc. / NASA Goddard Space Flight Center
SEE Symposium and MAPLD are supported by Cobham Semiconductor Solutions, the Aerospace Corporation, Brigham Young University, Lockheed Martin, the NASA Electronic Parts and Packaging Program, the Naval Research Laboratory, Sandia National Laboratories, and Vanderbilt University.
SEE Symposium and MAPLD are sponsored by SEE Symposium, California