2015 Single Event Effects Symposium and Military and Aerospace Programmable Logic Devices Workshop

Sunday - May 17th, 2015 Welcome to SEE/MAPLD
5:00:00 PM	Workshop Registration and Registration Reception Soledad Ballroom
	5:00 PM - 8:00 PM
8:00:00 PM	End of Registration Reception

Monday - May 18th, 2015 Single Event Effects (SEE) Sessions
Start Time	Session	Talk
7:30:00 AM	Registration in Salon A Foyer 7:30 AM - 5:00 PM
8:40:00 AM	Introduction	Opening Remarks
9:00:00 AM	Measurement Techniques and Facilities Chair: Anthony Amort, Boeing	Investigation of Sub-Micron Focusing of Pulsed X-rays for Single Event Effects Testing David Cardoza, The Aerospace Corporation
9:20:00 AM		Online Measurement of Heavy Ion Energy at the SEE Test Facility in FLNR Semen Mitrofanov, FLNR JINR
9:40:00 AM	Break (30 mins)
10:10:00 AM	Measurement Techniques and Facilities (cont.)	Two-Photon Absorption Induced Charge Deposition in Silicon by Ultrashort Optical Pulses: Quantitative Considerations Dale McMorrow, Naval Research Laboratory
10:30:00 AM	Devices and Technologies Chair: J.J. Wang, Microsemi	Invited Talk: Single Event Effects in FinFET Technologies Norbert Seifert, Intel Corporation
11:00:00 AM		Radiation-hardened Optically Reconfigurable Gate Array Using a Negative Logic Configuration Without Necessity of a Dedicated VLSI Minoru Watanabe, Shizuoka University
11:20:00 AM		Invited Talk: Soft Errors Handling for Commercial Terrestrial System ShiJie Wen, Cisco Systems
11:50:00 AM	Lunch (1 hour & 20 mins) 11:50AM - 1:10 PM
1:10:00 PM	Devices and Technologies (cont.)	A Comparison of Single-Event Transients in Pristine and Irradiated AlGaN/GaN HEMTs using Pulsed Laser Light to Generate Carriers via Two-Photon Absorption Stephen Buchner, Naval Research Laboratory
1:30:00 PM	Devices and Technologies (cont.)	Radiation Induced Single Ion Switching in Carbon Nanotube Field Effect Transistors Adam Bushmaker, The Aerospace Corporation
1:50:00 PM	Panel Session: RHBD for Future Technologies	RHBD for Future Technologies Panel: Anthony Wilson, Cobham; Jonathan Pellish, NASA/GSFC; David Merodio Codinachs, ESA; Lewis Cohn, NRO; Brett Attaway, Synopsys; Anthony Amort, Boeing Can it be effectively implemented? Will we need it? What can be achieved and what will the penalties be? Panel members from major users and developers of RHBD hardened electronics will give their views of RHBD in the future and discuss questions in a Q/A session
2:30:00 PM	Break (30 mins)
3:00:00 PM	SEE Hardening Techniques Chair: David Cardoza, Aerospace	Efficacy of N-well Separation in Mitigating Single-Event Upsets in Dual Interlocked Cell Flip-Flops at a 20-nm Bulk CMOS Node Nelson Gaspard, Altera Corporation
3:20:00 PM		Layout based RHBD for Sequential and Combinatorial Logic Klas Lilja, Robust Chip, Inc.
3:40:00 PM		Porting & Scaling Strategies for Nanoscale CMOS RHBD Robert Shuler, Shuler Research
4:00:00 PM	SEE Characterization and Analysis Chair: Lew Cohn, NRO	Single Event Transient Response of InGaSb p-MOSFETs using Pulsed Laser Excitation: Comparison between Buried and Surface Channel Structures Jeffrey Warner, Naval Research Laboratory
4:20:00 PM		Voltage Dependency of Soft Error Rates for Flip-flops in a 28nm Technology Process Haibin Wang, University of Saskatchewan
4:40:00 PM		Analyzing the Radiation Hardness of an NCL Library John Brady, University of Arkansas, Fayetteville
5:00:00 PM	End of Monday Sessions

Tuesday - May 19th, 2015 SEE Sessions (cont.) and Combined SEE/MAPLD Sessions
Start Time	Session	Talk	Event
8:00:00 AM	Registration in Conference Office 8:00 AM - 5:00 PM
8:40:00 AM	SEE Testing: Products and Applications I (ASICS) Chair: Agustín Fernández-León, ESA	CubeSat and Mobile Processor SEE Testing Steven Guertin, NASA/JPL	Industrial Exhibit Chair: Teresa Farris, Aeroflex Cobham
9:00:00 AM		SEE test results on SOFRADIR NGP Detector ROIC Cesar Boatella Polo, ESA ESTEC
9:20:00 AM		Single Event Effects Induced by High Energy Protons in Gumstix Computer on Module Technology Kathleen Morse, Yosemite Space
9:40:00 AM	Break (30 mins)
10:10:00 AM	SEE Testing: Products and Applications II (Analog & Mixed Signal) Chair: Craig Stodard, Infineon	Heavy Ion SEE Testing of Multi-gigaHertz 32nm RHBD Analog/Mixed Signal Macros Ethan Cannon, The Boeing Company
10:30:00 AM		Destructive SEE in Linear Devices with Gold-Plated Package Lid Daniel Clymer, Lockheed Martin
10:50:00 AM		SEU/SET Response of a High Speed PLL in 90nm Technology Anthony Wilson, Cobham Semiconductor Solutions
Combined SEE/MAPLD Sessions Begin
11:10:00 AM	SEE Hardening Techniques Chair: David Cardoza, Aerospace	Invited Talk: Fail-Safe Strategies for FPGA Devices Targeted for Critical Applications Melanie Berg, AS&D Inc. / NASA GSFC
11:50:00 AM	Lunch ( 1 hour & 20 mins) 11:50 AM - 1:10 PM
1:10:00 PM	SEE Hardening Techniques (cont.)	New ECSS Handbook on "Techniques for Radiation Effects Mitigation in ASICs and FPGAs" Agustín Fernández-León, ESA
1:30:00 PM		Reducing Performance Degradation in Software Detection Techniques on Embedded Processors Eduardo Chielle, Universidade Federal do Rio Grande do Sul
1:50:00 PM		Invited Talk: Applying Best Practices for SEU Mitigation and Monitoring to FPGA Designs Robert Perry, Synopsys
2:30:00 PM	Break (30 mins)
3:00:00 PM	SEE Testing: Products and Applications III (FPGAs) Chair: Yanzhong Xu, Altera	Single Event Upset Characterization of Fabric SRAM in 65 nm RTG4 Flash-Based FPGA Nadia Rezzak, Microsemi
3:20:00 PM		SEUs Effects on Virtex-5 SRAM-based FPGAs: Radiation Experiment of New Analysis and Mitigation Method David Merodio Codinachs, ESA
3:40:00 PM		Single Event Effects Testing Results in Sandia National Laboratories Via Programmable ASIC Platforms Jeffrey Black, Sandia National Laboratories
4:00:00 PM		Single Event Effects in Microsemi’s Radiation-Tolerant reprogrammable RTG4 flash FPGA Durwyn Dsilva, Microsemi
4:20:00 PM		Micro-Latchup in 7-Series FPGAs and Other Ongoing XRTC Investigations Gary Swift, Swift Engineering and Radiation Services, LLC
4:40:00 PM		Solar Particle Event Detector inside FPGAs Robért Glein, Friedrich-Alexander-Universität Erlangen-Nürnberg
5:00:00 PM	End of Tuesday Sessions
5:30:00 PM	Industrial Exhibit Reception 5:30 - 8:00 PM
8:00:00 PM	End of Industrial Exhibit Reception

Wednesday - May 20th, 2015 Combined SEE/MAPLD Sessions (cont.) and MAPLD Sessions
Start Time	Session	Talk	Event
8:00:00 AM	Registration in Conference Office 8:00 AM - 5:00 PM
8:30:00 AM	Single Event Error Rate Prediction Chair: Les Palkuti, DTRA	Proton Cross-Sections from Heavy-Ion Data in Deep-Submicron Technologies David Hansen, Maxwell Technologies	Industrial Exhibit
8:50:00 AM		32 nm SOI SRAM and Latch SEU Cross-sections Measured (Heavy Ion Data) and Determined with Simulations Marek Turowski, Robust Chip, Inc.
9:10:00 AM		Invited Talk: Geant4 - Recent Developments and Applications for SEE Simulation Makato Asai, SLAC, Stanford University
9:40:00 AM	Break (30 mins)
10:10:00 AM	Single Event Error Rate Prediction (cont.)	Invited Talk: Prediction of Single Event Error Rates for Space: From Devices to SOCs Manuel Cabanas-Holmen, The Boeing Company
MAPLD Sessions Begin
10:40:00 AM	SEE in FPGA Chair:Melanie Berg, AS&D	Invited Talk: Microsemi Next Generation Radiation Tolerant FPGAs Ken O'Neill, Microsemi
11:10:00 AM		The Use of Benchmarks for Radiation Testing Heather Quinn, Los Alamos National Laboratory
11:30:00 AM		A Preliminary Investigation of the Xilinx Kintex-7 GTX Multi-Gigabit Transceivers in Heavy-Ion Irradiation David Lee, Sandia National Laboratories
11:50:00 PM	Lunch ( 1 hour & 20 mins) 11:50 AM - 1:10 PM
1:10:00 PM	Special Proton Session	Special Proton Session Featuring: Introductions and presentations from more than ten major proton facilities Current findings from the government team exploring options The "new guys": Cancer therapy sites that are on-line across the U.S.
3:00:00 PM	Break (30 mins)
3:30:00 PM	SEE in FPGA (cont.)	Invited Talk: General View on ESA Work on Mitigation for COTS FPGAs David Merodio Codinachs, ESA
4:10:00 PM		Invited Talk: XILINX VIRTEX-5QV Qualification Update Kangsen Huey, Xilinx
4:50:00 PM	End of Wednesday Sessions
Poster Session and Happy Hour Begins
5:15:00 PM TO 8:00:00 PM	Poster Session Chair: Martha O'Bryan, AS and D, Inc. / NASA GSFC	Dependability Modeling Methodology for Reconfigurable Field Programmable Gate Arrays Rafał Graczyk, Centrum Badań Kosmicznych PAN (Space Research Centre of Polish Academy of Sciences)
		Pulsed X-ray and Laser Single Event Latchup Testing of an Operational Amplifier Stephen LaLumondiere, The Aerospace Corporation
		Predicting Single Event Coupling Delay in Nanometer Technologies Selahattin Sayil, Lamar University
		Design of Testable Adder Circuits for Spintronics Based Nanomagnetic Computing Himanshu Thapliyal, University of Kentucky
		SEU and SET Measurements for Hardened Sequential and Combinatorial Logic in 32nm SOI Technology Mounaim Bounasser, Robust Chip, Inc.
		The Feasibility of Automated Black-box Detection of Anomalous Behaviour on a Device Using Differential Frequency Analysis Pater Ateshian, Naval Postgraduate School, Jasper vanWoundenberg, Riscure North America
8:00:00 PM	End of Poster Session and Happy Hour

Thursday - May 21st, 2015 MAPLD Sessions (cont.)
Start Time	Session	Talk
8:00:00 AM	Registration in Conference Office 8:00 AM - 1:00 PM
8:30:00 AM	SEE in FPGA (cont.)	Invited Talk: Accelerator Radiation Environment and the Use of FPGAs in those Environments Helio Takai + Michael Wirthlin, Brigham Young University
9:00:00 AM	Embedded Processor and Programmable SoC Chair: Gregory Allen, JPL	Fault Injection Results of Soft Processors within the Xilinx Virtex-5 FPGA Michael Wirthlin, Brigham Young University
9:20:00 AM		Migrating SoC Designs to 4th Generation Flash-based Devices Jan Andersson, Cobham Gaisler AB
9:40:00 AM	Break (30 mins)
10:10:00 AM	Embedded Processor and Programmable SoC (cont.)	Invited Talk: Safety-critical Multicore Activities within Automotive and Avionics Jürgen Becker, Karlsruhe Institute of Technology
10:40:00 AM		Neutron Radiation Test Results of the Linux Operating System Executing within the CHREC Space Processor (CSP) Michael Wirthlin, Brigham Young University
11:00:00 AM		RC64: High Performance Rad-Hard Manycore with FPGA Extension for Telecomm Satellites and other Space Applications Ran Ginosar, Ramon Chips
11:20:00 AM		A Novel Frame-level Redundancy Scrubbing Technique for SRAM-based FPGAs Jorge Tonfat, UFRGS
11:40:00 AM	Lunch (1 hour & 30 mins) 11:40 AM- 1:10 PM
1:10:00 PM	Design and Verification Methodologies Chair:Dave Borowski, Lockheed Martin	A Methodology for Safety Critical Aerospace Firmware Design Stefanos Skoulaxinos, UTC Aerospace Systems
1:30:00 PM		Performance and Fault Analysis Using a Virtual Platform Jon McDonald, Mentor Graphics
1:50:00 PM		Simplified UVM for FPGA Reliability Shashi Bhutada, Mentor Graphics
2:10:00 PM	Systems and Applications Chair:Robert Perry, Synopsys	In-Space Debugging to Detect Errors caused by Single Event Effects Florian Rittner, Friedlich Alexander Universität Erlangen Nürnberg
2:30:00 PM		Integration of Fourier Transform Spectrometer Electronics into a Fault-tolerant System-on-Chip for Exploring Harsh Space Environments Xabier Iturbe, NASA/JPL
2:50:00 PM		A Rad-Tolerant FPGA Design for NASA GSFC's MMS Mission David Thorndike, Zin Technologies, Inc.
3:10:00 PM	End of MAPLD Sessions and Workshop

General Chair(s): Dale McMorrow, NRL (SEE) / Brett Attaway, Synopsys (MAPLD)
Technical Program Chair(s): Klas Lilja, Robust Chip, Inc. (SEE) / Fernanda Lima Kastensmidt, UFRGS (MAPLD)
Poster Session Chair: Martha O'Bryan, AS and D, Inc. / GSFC
Industrial Exhibit Chairwoman: Teresa Farris, Aeroflex Corp.
Local Arrangements & Registration Services: Susan Hunt, STAMP Services
Website Curator: Carl Szabo, AS and D, Inc. / GSFC

SEE Symposium and MAPLD are supported by the Aeroflex Corporation, the Aerospace Corporation, Brigham Young University, Lockheed Martin, the NASA Electronic Parts and Packaging Program, the Naval Research Laboratory, Sandia National Laboratories, and Vanderbilt University.

SEE Symposium and MAPLD are sponsored by SEE Symposium, California