2024 SEE/MAPLD Schedule
Tuesday, May 14, 2024 | ||||
Time (PST) | Session | Title | Speaker | Organization |
8:10 AM | Intro | Workshop Opening Remarks | Adrian Ildefonso | US Naval Research Laboratory |
8:20 AM | SEE Technical Program Introduction | Krysten Pfau | Lockheed Martin | |
8:30 AM | Environments and Facilities | Session Intro | ||
8:40 AM | Understanding High Energy SEE and Opportunities at Brookhaven National Laboratory | Kevin Brown | Brookhaven National Laboratory | |
9:00 AM | Status of the K150 Cyclotron Upgrade Project and Radiation Effects User Statistics at Texas A&M University | Henry Clark | Texas A&M University | |
9:20 AM | Ongoing Developments at the 88-Inch Cyclotron | Janilee Benitez | LBNL | |
9:40 AM | 88-Inch Cyclotron BASE Facility Microbeam Update 2024 | Mike Johnson presenting for Alex Donoghue | LBNL | |
10:00 AM | Break | |||
10:30 AM | Environments and Facilities | The RADHUB Radiation Hardness Assurance Tool Suite | Brian Sierawski | Vanderbilt University |
10:50 AM | Tutorial | Development of Space Environmental Effects Digital Laboratory (SEE-D Lab) for the Natural Space Radiation Environment | Kerry Lee | The Aerospace Corporation |
11:20 AM | The Proton Radiation Environment in LEO & MEO: an Overview of Variability and Risks | Alex Lozinski | UCLA | |
11:50 AM | Lunch | |||
1:30 PM | Education and Workforce Development | Session Intro | ||
1:40 PM | LabRaTTS: Laboratory Radiation Test Training Simulator | Brian Sierawski | Vanderbilt University | |
2:00 PM | NASA Parts Engineering School | Seth Gordon | JPL | |
2:20 PM | Texas A&M University Cyclotron Institute Single Event Effects (SEE) Bootcamp Evolution | Gregory Allen/Megan Casey | NASA | |
2:40 PM | Academy for Radiation Effects and Survivability | Justin Likar/Ken LaBel | JHU/APL | |
3:00 PM | Break | |||
3:30 PM | Emerging SEE Test Alternatives | Session Intro | ||
3:40 PM | Neutron Single Events Effects (nSEE) Testing for Microelectronics Resilience in Strategic Environments | Robert Cooper | Naval Surface Warfare Center - Crane | |
4:00 PM | Criteria for Predicting Heavy-Ion SEE Response Using Surrogate Testing Approaches | Joel Hales | US Naval Research Laboratory | |
4:10 PM | Screening SEL susceptibility in COTS devices using pulsed Laser | Jeremy Guillermin | TRAD | |
4:30 PM | Pulsed Electrons for Alternative Radiation effects Characterization of Electronics (PEARCE): An Update | George Tzintzarov | The Aerospace Corporation | |
4:50 PM | An Update on Pulsed X-ray SEE Testing Capability Development | Daniele Monahan | The Aerospace Corporation | |
5:10 PM | CHALICE: Calculator for Highly Accurate Laser-Induced Carrier Excitation | Adrian Ildefonso | US Naval Research Laboratory | |
5:30 PM | End Tuesday May 14 |
Wednesday, May 15, 2024 | ||||
Time (PST) | Session | Title | Speaker | Organization |
8:00 AM | Announcements | |||
8:10 AM | SEE Testing and Mitigation | Session Intro | ||
8:20 AM | Use of Bragg Search Testing at TAMU K500 Cyclotron for Determining Overmold Density for Unknown Materials on Sunnyside-Up Parts | Keri Kuhn | SEAKR Engineering LLC. | |
8:40 AM | Comparison of Oscillator Single Event Effects Observed for Heavy Ion and Pulsed Laser Testing | George Ott | Radiation Test Solutions | |
9:00 AM | Impact of Test Equipment on Single-Event Latchup Susceptibility | Ahmad Omair | Cyclo Technologies, Inc. | |
9:20 AM | Heavy-Ion SET Response of a Wide-Band Operational Amplifier Fabricated in the SkyWater S90LN 90 nm Process | James Carpenter | Indiana University | |
9:40 AM | Built-in Self-Test Architecture for Characterization of Single Event Effects in Commercially Available Bulk 90nm Technology | Spencer Westfall | Indiana University | |
10:00 AM | Break | |||
10:30 AM | Invited Talk | Invited Talk: The Winding Path from SME to Policy Advisor - REMOTE | Jonathan Pellish | |
11:10 AM | FPGA SEE Testing | Session Intro | ||
11:20 AM | SEE rate observations and rate predictions across several generations of AMD-Xilinx FPGAs | Sebastian Sabogal | NASA GSFC | |
11:40 AM | Multi-bit Upsets in Space FPGAs | David Lee | Sandia National Labs | |
12:00 PM | Lunch | |||
1:30 PM | FPGA SEE Testing | Tales from the Cave: Beam Lessons Learned | Gary Swift | Swift Engineering & Radiation Services |
1:50 PM | Testing Versal 1902 ACAP on XRTC Gen-4 SEE Platform | Gary Swift presenting for Hermann Rufenacht | XRTC | |
2:10 PM | Single Event Upset Characterization of the Versal AI Core dual-core ARM Cortex A72 Application Processor Unit and Deep Learning Processing Unit Using Proton Irradiation | Nelson Hu | MDA Canada | |
2:30 PM | SEE Simulation and Data Analysis Techniques | Session Intro | ||
2:40 PM | A Review of Single Event Upset Rate Calculation Methods | Dave Hansen | L3 Harris | |
3:00 PM | Break | |||
3:30 PM | SEE Simulation and Data Analysis Techniques | VIRAD: A New Method for Combined-Radiation-Environment Integrated Circuit Analysis | Conrad Jensen | Reliable MicroSystems |
3:50 PM | Curve Fitting to Non-Saturating SEE Data | Bill Rowe | Raytheon | |
4:10 PM | Proposal of a Multi-Scale High Accuracy Engineering approach for Single Event Effects Analysis in Modern Technologies | Jeremy Guillermin | TRAD | |
4:30 PM | Break | |||
5:30 PM | Industrial Reception | |||
8:00 PM | End Wed May 15 |
Thursday, May 16, 2024 | ||||
Time (PST) | Session | Title | Speaker | Organization |
8:00 AM | SEE Simulation and Data Analysis Techniques | Session Intro | ||
8:10 AM | Hierarchy of Knowledge: SEL Edition | Ray Ladbury | NASA GSFC | |
8:30 AM | Systematic Assurance Analysis of Components Radiation Effects on System Performance | Qi Zhang | Vanderbuilt University | |
8:50 AM | Intro | Combined/MAPLD Introduction Technical Program Introduction | Tom Leahy | SiFive |
9:00 AM | SEE Case Study | Session Intro | ||
9:10 AM | Heavy Ion Induced SEU and MBU Sensitivity of 3D NAND Flash Structures | Jeremy Guillermin | TRAD | |
9:30 AM | Recent Observations during SEE Testing of Various Memory Products | Helmut Puchner | Infineon | |
9:50 AM | Operating System Dependencies on Radiation Reliability in CPU Memory | Seth Roffe | NASA GSFC | |
10:10 AM | Break | |||
10:40 AM | SEE Case Study | Novel Protection of Half-Bridges in Space Environments | Alex Billings | Apogee Semiconductor |
11:00 AM | An Overview of SEEs in RFIC/MMIC | Jeffrey Teng | Georgia Tech | |
11:20 AM | Verifying SEFI Requirements for SOCs and Other Complex Devices | Steve Guertin | JPL | |
11:40 AM | The Use of Block Rolling Offset during TID Testing for Memory Parts | Keri Kuhn | SEAKR | |
12:00 PM | Lunch | |||
1:30 PM | Novel Applications Case Study | Session Intro | ||
1:40 PM | SEE and TID Radiation Test Results for Managed Flash Memory Devices | Ian Troxel | Troxel Aerospace Industries | |
2:00 PM | Update on qualification info on Versal, plans for VE2302 | Ken O'Neill | AMD | |
2:20 PM | Heavy Ion testing results on multi-GB STT-MRAMs | Paul Chopelas | Avalanche Technologies | |
2:40 PM | Tutorial | Open Standards | Tom Leahy | SiFive |
3:10 PM | Break | |||
3:40 PM | Novel Applications Case Study | Revolutionizing UAV Control: Integrating NLP with Advanced FPGA and FPAA Technologies for Dynamic Reconfigurability | Mohamed El-Hadedy | Cal Poly Pomona |
4:00 PM | Advanced Node FPGAs for Edge Processing | Jim Tavacoli | Lattice Semiconductor | |
4:20 PM | Break | |||
5:30 PM | Poster Session & Career Networking Happy Hour
"What’s New in the Domestic Proton Access for SEE (>200 MeV prime)" Ken LaBel, SSAI / NASA GSFC "Radiation Characterization of the COTS MyriadX Edge Vision Processing Unit and Use Case in Space Applications" Lucas Tambara, Gaisler "Recently updated MIL-PRF-38535 spec embraces plastic packaging for next generation ICs" Kurt Eckles, Texas Instruments "SEE results of radiation tolerant MOSFETs" Oscar Mansilla, Infineon Technologies "Radiation Hardness Assurance of the 3D PLUS Monitoring CAMera (MCAM) system in the frame of MSR-ERO mission" Ameur Sellai, 3D PLUS "Harnessing Machine Learning: Parallel Testing and Real-Time Analysis for Accelerated Radiation Effects Dataset Generation" Trevor Peyton, Indiana University |
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8:00 PM | End Thursday May 16 |
Friday, May 17, 2024 | ||||
Time (PST) | Session | Title | Speaker | Organization |
8:00 AM | Design, V&V, and Technical Management of FPGAs/SoCs and PLDs | Session Intro | ||
8:10 AM | Versal-based Space Applications (placeholder title) | Thomas Bradshaw | Sandia National Labs | |
8:30 AM | SDRAM Challenges in Space | Robert Hillman | Power Device Corporation | |
8:50 AM | MAPLD - Optimize FPGA & SoC Configuration for Speed, Resilience & Adaptability | Paul Chopelas | Avalanche | |
9:10 AM | FLASH Memory Challenges in Space | Robert Hillman | Power Device Corporation | |
9:40 AM | Rad-Hard 16Gb COnfiguration Memory BOot Manager | Pierre-Eric Berthet presenting for Patrice Benard | 3D PLUS | |
10:00 AM | Break | |||
10:30 AM | FPGA & SoC Assurance | Session Intro | ||
10:40 AM | Synplify Debug Solution for Functional Safety and High Reliability in FPGAs | De'Andre Doughty Hoskins | Synopsys | |
11:00 AM | Optimal SEU Mitigation for FPGA Based Hardware Acceleration of C/C++ Applications | Kamesh Ramani | Siemens EDA | |
11:20 AM | Next Step in Low Power Space Processing | David Matthes | BAE | |
11:40 AM | Closing Remarks | |||
12:00 PM | End Friday May 17 |