Welcome to the 31st Edition of the Single
Event Effects (SEE) Symposium
coupled with the Military and Aerospace Programmable Logic Devices (MAPLD)
Workshop
We are returning to La Jolla, CA!
May 15th - 19th, 2022
For an in-person event
Our workshop will feature content including, but not limited
to, the following areas:
Artificial intelligence & machine learning (AI / ML)
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Continuing education & workforce development
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Designing with field programmable gate arrays (FPGAs) / systems on a chip (SoCs) /
new devices
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FPGA & SoC assurance
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Guidelines and standards
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On-orbit experiments & model validation
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Radiation hardness assurance (RHA)
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SEE test facilities
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SEE in devices & circuits / mechanisms & modeling
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Space environments
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Visit Our Presentation Archive!
Featuring over 700 talks spanning years 2006-2020
Jump to the Archives
Official SEE/MAPLD COVID-19 Policy:
Health and safety of our attendees and staff are our first priorities
As previously stated, all attendees and their guest should be fully vaccinated as per
CDC definition as of 4/1/2022
- No records are being kept of attendee vaccination status and fully vaccinated attendees will simply be required to show hardcopy or electronic (phone) copy of their vaccination record at SEEMAPLD registration desk for badge pickup
- No face mask is required if an individual is fully vaccinated, however, face masks are strongly encouraged as per the CDC for indoor events
Individuals should not enter the venue if experiencing any flu-like symptoms or feeling ill
Accommodations as per federal regulations are available for religious and medical exemptions:
- Exemptions should be requested at least one week prior to on-site arrival via electronic or hardcopy requests
- Medical exemptions require appropriate attestation letter by a medical professional (M.D., D.O., P.A., nurse practitioner, nurse, or equivalent)
- Exempted individuals are also required to provide results of a COVID-19 test taken either 48 hours prior (PCR type test) or 24 hours prior (antigen type test) to start of the event (or attendee/individual arrival date)
- If the individual has been diagnosed with COVID-19 within 90 days of the event start, test results are not required. In this case, false positives may occur and an attestation from a relevant medical professional stating the diagnosis and date is required
- Negative results should be provided by the exempted individual at the meeting registration desk prior to entering the event venue
- Exempted individuals are required to wear masks in all meeting areas except while actively eating or drinking
This COVID-19 policy is subject to change as the pandemic evolves or new guidance becomes available
This policy is compliant with federal and local government medical privacy regulations
2022 SEE/MAPLD Workshop Call for Papers
We are seeking contributions in the following areas, but all submissions will be reviewed. Four sessions are available: SEE, MAPLD, Combined, and Poster.
The Combined Session includes submissions that cross SEE and MAPLD themes. The Poster Session can include SEE, MAPLD, or Combined content. Please refrain
from technical content reasonably classified as product marketing.
We especially encourage the submission of content focusing on:
1) Standards & Methods |
4) Modeling and Simulation |
2) Alternatives to Heavy Ion and Proton Testing |
5) Relevant Test Facility Updates |
3) Space Environments |
Abstract Submission Guidelines:
Abstract submissions are a minimum of 1 and a maximum of 4 pages for MS Word
PowerPoint charts should provide a title page with authors and affiliations, motivation / context / overview, available relevant results, and anticipated conclusions
The required file format is MS Word .docx or MS Powerpoint .pptx or Adobe PDF (refer to templates provided below)
MS Word DOCX abstract template (.docx)
MS Powerpoint PPTX abstract template (.pptx)
Deadline for submissions has passed; Submission page is now closed.
SEE Symposium / Combined* / MAPLD Session Options
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New! Artificial Intelligence (AI) / Machine Learning (ML) in FPGAs/SoCs: AI / ML design considerations for reliable terrestrial, avionic, and aerospace applications; using AI for SEE mitigation; SEE evaluation of designs leveraging AI / ML
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Phenomena: Upsets, Functional Interrupts, Transients, Latchup, Gate Rupture, Burnout, etc.
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FPGAs/SoCs, PLDs, and New Devices: New and/or novel FPGA and PLDs; Benchmarking of FPGAs and PLDs; Applications of space-borne processing.
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Basic Mechanisms and Modeling: Destructive and Non-Destructive Effects, Nanoscale Phenomena, Charge Transport and Collection, Impact of Circuit and Environmental Parameters, etc.
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Mitigation of Single event effects in FPGAs/SoCs, PLDs, and commercial electronics: Multi-level approaches for high reliability and fault tolerance (redundancy, TMR, SET filtering, etc…), upset mitigation techniques and automated tools, etc.
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SEE Mitigation Methods Including Radiation Hardened by Design (RHBD) and by Process (RHBP): Approaches for gaining SEE hardness in commercial devices, etc.
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Designing with FPGAs/SoCs, and PLDs: agile methods, ESL/HLS and model-based engineering techniques, embedded processing, and synthesis efficiency improvements.
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Environments and Facilities: Space, Atmospheric and Terrestrial environments. Heavy Ion, Proton, Neutron and Pulsed Laser Test Facilities.
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Validation and Verification of FPGAs/SoCs, and PLDs: Verification techniques and languages such as co-simulation, System Verilog and OVM/UVM. Simulation speed-up techniques, emulation, new tools and methods for design validation.
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Operational Regimes and Performance Data: Systems and Devices from LEO to Interplanetary, High Altitude Aircraft, and Terrestrial.
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Availability/Reliability/Susceptibility of programmable devices: Failure mechanisms, reliability testing and characterization, packaging reliability, reliable design practices.
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Electronic & Photonic Device Data and Measurement Techniques: Memories, Analog/Digital Circuits, systems-on-chip (SoCs), Field Programmable Gate Arrays (FPGAs), Optocouplers, Photonic Integrated Circuits, Power Converters, Sensors, etc.
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Novel Applications and Case Studies: Reconfigurable computing, high-performance processing using programmable logic, successful deployment of programmable logic, etc.
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Systems and Error Rate Computation: Error Mitigation, Error Detection & Correction, Multi-core Processing, and Fault Tolerant Systems; Analytic, Monte Carlo, Mixed-Level, methods, etc.
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Technical Management of FPGAs and PLDs: Technical leadership, process management and metrics.
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Education: Education Practices, Market Demands for Military and Aerospace Component Engineers, and Engineer Retention.
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*All options subject to change any time, per the discretion of the conference committee
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Time (PST) |
Session |
Speaker |
5:30 PM
8:00 PM
|
Workshop Registration and Registration Reception 5:30 - 8:00 PM Soledad Ballroom |
End of Activities for Sunday |
Time (PST) |
Session |
Speaker |
7:00 AM |
|
Registration in Salon A Foyer: 7:00AM - 4:30PM Breakfast 7:00AM
- 9:00AM
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8:00 AM |
Intro
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Workshop Opening Remarks
Rebekah Austin, NASA/GSFC; Steve LaLumondiere, The Aerospace Corporation; Tyler Lovelly,
AFRL
SEE Technical Program Introduction
Chair: Daniel Loveless, University of Tennessee at Chattanooga
|
8:10 AM |
Tutorial
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Introduction to Tutorials
Chair: Milton Diaz, SRI International
|
8:20 AM |
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Tutorial 1: The Cost of a Beam Hour
Henry Clark, Texas A&M
|
8:45 AM |
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Tutorial 2: Cost Factors Associated with an SEE Test
Ted Wilcox, NASA/GSFC
|
9:10 AM |
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Tutorial 3: SEE Test Services Costs and Considerations: From Running the
Beam to Complete Turnkey SEE Testing
Mike Tostanoski, Radiation Test Solutions
|
9:35 AM |
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Tutorial 4: Characterizing Commercial SoC (System on Chip)
FPGAs for Potential Space Use
Allyson Yarbrough, The Aerospace Corporation
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10:00 AM |
BREAK: 30 Minutes |
10:30 AM |
Session A
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Introduction to Environments and Facilities Session
Chair: Justin Likar, Johns Hopkins University Applied Physics Laboratory
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10:40 AM |
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DoD and Heavy Ion SEE Facilities
Courtney Matzkind, Missile Defense Agency
|
11:00 AM |
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A New Heavy Ion Single-Event Effects Test Facility at Michigan State
University
Steve Lidia, Michigan State University
|
11:20 AM |
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LBNL 88-Inch Cyclotron BASE Facility 2022 Update
Alexander Donoghue, Lawrence Berkeley National Laboratory
|
11:40 AM |
LUNCH: 1 Hour 30 Minutes |
1:10 PM |
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ESA Update on European Irradiation Facilities
Anastasia Pesce, ESA
|
1:30 PM |
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Future Options with Proton Facilities
Ken LaBel, SSAI@NASA/GSFC
|
1:50 PM |
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Status of the High Energy Effects Test Facility Project at Brookhaven National
Laboratory
Kevin Brown, Brookhaven National Laboratory
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2:10 PM |
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Heavy Ion and Proton Testing at Texas A&M University
Henry Clark, Texas A&M University
|
2:30 PM |
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The RADNEXT Facility Network and Related SEE Irradiation Opportunities
Mario Sacristán Barbero, CERN
|
2:50 PM |
BREAK: 30 Minutes |
3:20 PM |
Panel
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Panel Discussion: Optical/Photonic Modeling
Moderator: Steve Moss, Scientist
Panelists
Todd Rose, The Aerospace Corporation; Robert Reed, Vanderbilt University; Kaitlyn
Ryder, NASA/GSFC; Alexandre LeRoch, NASA/GSFC
|
4:20 PM |
Session B
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Introduction to Laser Facilities and Testing Session
Chair: Alexandre LeRoch, NASA/GSFC
|
4:30 PM |
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Pulsed Laser SEE Test Guidelines Desk Reference - Update
Dale McMorrow, Naval Research Laboratory
|
4:50 PM |
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Development and Applications of NRL Laser Beam Line to Study Wide Bandgap
Semiconductor Materials
Ani Khachatrian, Naval Research Laboratory
|
5:10 PM |
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Pulsed X-ray Single-Event Transient Measurements
on a PLL with Integrated VCO
Daniele Monahan, The Aerospace Corporation
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5:30 PM |
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Not All Pulsed-Laser SEEs are Created Equal: The Importance of Accurate
Characterization and Reporting of Pulsed-Laser Parameters
Adrian Ildefonso, Naval Research Laboratory
|
5:50 PM |
End of Monday Technical Sessions |
End of Activities for Monday |
Time (PST) |
Session |
Speaker |
7:00 AM |
|
Registration in Salon A Foyer: 7:00AM - 4:00PM Breakfast 7:00AM
- 9:00AM
|
8:00 AM |
Invited
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Invited Talk: Thriving in a Male Dominated Profession
Minal Sawant, AMD
|
8:30 AM |
Session C
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Introduction to Education and Workforce Development Session
Chair: Deb Newberry, Newberry Technology Associates
|
8:40 AM |
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The SCALE Radiation Effects Workforce Development Program
Daniel Loveless, University of Tennessee at Chattanooga
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9:00 AM |
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Texas A&M Master's Program
Henry Clark, Texas A&M University
|
9:20 AM |
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Texas A&M SEE Bootcamp Debrief
Michael Campola, NASA/GSFC
|
9:40 AM |
BREAK: 30 Minutes |
10:10 AM |
Panel
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Workforce Development Panel: What's Missing from the Way Forward?
Moderator: Greg Allen, NASA Jet Propulsion Laboratory
Panelists
Daniel Loveless, University of Tennessee; Michael Campola, NASA GSFC; Allyson Yarbrough, The Aerospace Corporation; Vickie Wall, Versatile Workforce
|
11:10 AM |
Invited
|
Invited Talk: 3D and Heterogeneous Integration Challenges
Anu Ramamurthy, Microchip
|
11:40 AM |
LUNCH: 1 Hour 20 Minutes |
1:10 PM |
Session D
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Introduction to Electronic and Photonic Device Data, Techniques, and Diagnostics Session
Chair: Adrian Ildefonso, Naval Research Laboratory
|
1:20 PM |
|
Factors Affecting Single Event Effects (SEE) Sensitivity of a Part:
Evaluating Existing Information Pre-Test to Determine Expectations
Ken LaBel, SSAI@NASA/GSFC
|
1:40 PM |
|
Detection of Single Event Transients in Arbitrary Waveforms Using Statistical
Window Analysis
Jake Carpenter, University of Tennessee at Chattanooga
|
2:00 PM |
|
Risk-Driven and Mitigation-Focused SEFI Testing of NAND Flash Devices
Ted Wilcox, NASA/GSFC
|
2:20 PM |
|
The CERN R2E Project and SEEs in High-energy Accelerator Applications
Mario Sacristán Barbero, CERN
|
2:40 PM |
BREAK: 30 Minutes |
3:10 PM |
Session E
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Introduction to Advanced Devices and Integrated Circuits Session
Chair: Jason Riddley, NASA Jet Propulsion Laboratory
|
3:20 PM |
|
22FDX Compiled SRAM Single Event Effects
Steven Guertin, NASA Jet Propulsion Laboratory
|
3:40 PM |
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Single Event Upset Response of 12LP FinFET Digital Circuits
Jereme Neuendank, Arizona State University
|
4:00 PM |
|
RadHard Power ICs that Fit the Requirements, Longevity and Costs for
Satellites
Anton Quiroz, Apogee Semiconductor
|
4:20 PM |
End of Tuesday Technical Sessions - 1 Hour 10 Minute Break |
5:30 PM
8:00 PM
|
Industrial Exhibit 5:30 - 8:00 PM |
End of Activities for Tuesday |
Time (PST) |
Session |
Speaker |
7:00 AM |
|
Registration in Salon A Foyer: 7:00AM - 4:00PM Breakfast 7:00AM
- 9:00AM
|
8:00 AM |
Invited
|
Invited Talk: How Nuclear Data is Prepared
Lee Bernstein, Lawrence Berkeley National Laboratory
|
8:40 AM |
Session F
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Introduction to Data Analysis and Event Rate Computation Session
Chair: Ian Troxel, Troxel Aerospace Industries, Inc.
|
8:50 AM |
|
A Parametric Methodology for SEE Criticality Analysis
Michael Campola, NASA/GSFC
|
9:10 AM |
|
A Modest Proposal for Weibull Fitting of SEE Datasets
Gary Swift, Swift Radiation & Radiation Services
|
9:30 AM |
|
Interpreting Archival Cross-Section vs. LET Fit Parameters Based On Data
Quality
Ray Ladbury, NASA/GSFC
|
9:50 AM |
BREAK: 30 Minutes |
10:20 AM |
|
Using Track-Structure Theory to Calculate Proton Cross-Sections from Heavy-Ion
Data
David Hansen, Space Micro
|
10:40 AM |
|
SIRE2 Toolkit Update
Zachary Robinson, 5th Gait Technologies
|
11:00 AM |
Invited
|
Ingenuity and the Snapdragon - Results and Future Plans
Doug Sheldon, NASA Jet Propulsion Laboratory
|
11:50 AM |
LUNCH: 1 Hour 30 Minutes |
1:20 PM |
Session G
|
Introduction to Artificial Intelligence and Machine Learning Session
Chair: Evan Kain, Air Force Research Laboratory
|
1:30 PM |
|
Ramon.Space RC64-based AI/ML Inference Engine
Lisa Kuo, Ramon Space
|
1:50 PM |
|
Radical Thinking at Fundamental levels for AI Computation
Neil Sampson, GSI Technology
|
2:10 PM |
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Supervised Learning and Classification of Single-Event Transient Anomalies
Trevor Peyton, University of Tennessee at Chattanooga
|
2:30 PM |
BREAK: 30 Minutes |
3:00 PM |
Session H
|
Introduction to Circuits and Systems Session
Chair: Michael Pineiro, Raytheon
|
3:10 PM |
|
GR765 LEON5FT System-on-Chip: Results of First STM 28nm Test Chip Radiation
Test Campaign
Fabio Malatesta, Cobham Gaisler
|
3:30 PM |
|
Proton Evaluation of Xilinx/AMD Versal 7nm for Space 2.0: Programmable Logic
(PL), Processor (PS) and Internal Scrubber (XilSEM) Results
Pierre Maillard, AMD/Xilinx
|
3:50 PM |
|
Bridging the Gap Between Commercial and High Rel RadHard Components
Anton Quiroz, Apogee Semiconductor
|
4:10 PM |
|
Fault Propagation in Microprocessors
Stefania Esquer, Vanderbilt University
|
4:30 PM |
|
Guideline for Raspberry Pis in Space
Steven Guertin, NASA Jet Propulsion Laboratory
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4:50 PM |
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Data Center in Space: Cloud, Edge Computing and Big Data
Lisa Kuo, Ramon Space
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5:10 PM |
End of Wednesday Technical Sessions - 20 Minute Break |
5:30 PM
8:00 PM
|
Poster Session and Happy Hour 5:30 - 8:00 PM |
Access for Testing Electronics at U.S. Proton Therapy Centers is a Very
Dynamic Business
Ken LaBel, SSAI@NASA/GSFC
|
NASA Space Radiation Laboratory at Brookhaven National Laboratory: A Unique
Facility for Space-radiation Effect Studies
K. A. Brown, J. Gasparik, T. Olsen, C. Pearson, A. Rusek, M. Sivertz, Brookhaven
National Laboratory
|
Single Event Effects and Total Dose Considerations for NASA's Interstellar
Probe Mission
J. J. Likar, M. Donegan, J. Porter, J. Kinnison, A. Haapala, The Johns Hopkins
University Applied Physics Laboratory
|
NASA M-STAR 2021 Low Power Implementation of Flight Software
R. Herndon, Y. Zhang, D. Chiu, Princeton University; B. Banta, M. Walker, D.
Karthikeyan, G. Millan, A. Moussa, M. El-Hadedy, California State Polytechnic University
|
XTEA Encryption Comparison Using Arduino Uno and Raspberry Pi 3 B+
I. Elizarraz, G. Drumheller, A. Nguyen, A. S. Eddin, H. El-Naga, M. El-Hadedy,
California State Polytechnic University
|
TEA Performance
S. Cady, R. Schwartz, S. Yu, A. S. Eddin, H. El-Naga, M. El-Hadedy, California State
Polytechnic University
|
Hardware Benchmarking of Image Processing Using Alpha-Blended Images
D. Karthikeyan, E. Guzman, Y. Malik, H. El-Naga, A. S. Eddin, M. El-Hadedy, California
State Polytechnic University
|
System on Chip: H.264 Video Compression With PYNQ Z1
M. Hicks, C. Duong, E. Hwang, A. S. Eddin, H. El-Naga, M. El-Hadedy, California State
Polytechnic University
|
Reconfigurable Computing for Higher Orders S-Curve Motion Control
B. Tapia, B. J. Banta, H. Luc, S. D. Moore, J. A. Villegas, M. El-Hadedy, California
State Polytechnic University
|
Are Cosmic Neutrons a Threat to Pacemakers? Testing SRAMs With an Am-Be
Neutron Source
M. Plettenberg, German Aerospace Center & Justus-Liebig University; M. M. Meier, K.
Marsalek, K. Schennetten, German Aerospace Center; H. Zaunick, K. Brinkmann, Justus-Liebig
University
|
CCGA Solder Columns - Why They Are Needed for FPGA, ASIC and SOC Applications
Martin Hart, Teresa Farris, Topline Corporation
|
Functional Redundancy for Mitigation of SEE in Heterogeneous Computing Systems
S. Camp, J. Carpenter, T. Skjellum, D. Reising, T. D. Loveless, University of Tennessee
at Chattanooga; K. Linga, A. Raman, CFD Research Corporation
|
End of Activities for Wednesday |
Time (PST) |
Session |
Speaker |
7:00 AM |
|
Registration in Salon A Foyer: 7:00AM - 11:00AM Breakfast 7:00AM - 9:00AM
|
8:00 AM |
Invited
|
AMD Xilinx AI/ML Inference Solution
Jim Heaton & Steven Yeung, AMD/Xilinx
|
9:00 AM |
Intro
|
MAPLD Technical Program Introduction
Chair:Matthew Cannon, Sandia National Laboratories
|
9:05 AM |
Session I
|
Introduction to Session I: MAPLD
Chair:Gary Burch, Moog
|
9:10 AM |
|
Tensil - Open Source ML Accelerators
Thomas Alcorn and Peter Hizalev, Tensil
|
9:30 AM |
|
Large Capacity RC64-based & PolarFire-based Storage for Space Applications
Lisa Kuo, Ramon Space
|
9:50 AM |
|
Mantis: A Strategic Radiation Hardened Field Programmable Gate Array
Trey Peterson, Indiana University
|
10:10 AM |
BREAK: 30 Minutes |
10:40 AM |
|
Low Cost, On-Speed SEE Injection in FPGA Designs
Kamesh Ramani, Siemens Electronic Design Automation
|
11:00 AM |
|
Post-Quantum Stateful Hash-Based Signature Scheme for Improved Bluetooth Security
Mohamed El-Hadedy, California Polytechnic University
|
11:20 AM |
|
High-Performance Embedded Computing SoC for the Earth Surface Mineral Dust Source (EMIT) Instrument
Didier Keymeulen, NASA Jet Propulsion Laboratory
|
11:40 AM |
|
How Early Adoption of RTL Designer-Centric Solutions Improves Schedule Predictability
Rusty Stuber, Siemens Electronic Design Automation
|
12:00 PM |
End of Thursday Technical Sessions |
End of 2022 SEE/MAPLD Workshop |
Details about 2022 SEE/MAPLD Invited Speakers and/or Tutorial Sessions coming soon
2022 SEE/MAPLD Workshop - Registration Information
Jump to Exhibitor Registration
Ground Rules For All Attendees
|
Attendees MUST wear their name badges for admittance to the technical sessions, exhibits, and other functions
Registration and badges may not be shared
Badges are ONLY to be used by the person named on the badge
|
Registration for Attendees / Guests
|
SEE/MAPLD Technical Registration includes 3 1/2 days of Technical Sessions, Tutorials and Invited Speakers
Breakfast, lunch, and breaks are provided May 16-18, 2022
Breakfast and morning break are provided May 19, 2022
Sunday, May 15th: Registration Reception
Tuesday, May 17th: Exhibitor Reception
Wednesday, May 18th: Poster Reception
|
Registration Option |
Early |
Late (after Friday, April 15) |
Technical Attendee |
$800 |
$850 |
Student Attendee |
$375 |
$425 |
Registered Technical Attendees have a choice of guest badges
- The Reception Guest Badge provides access to the Registration Reception, Exhibitor Reception and Poster Reception
- The Conference Guest Badge provides access to all Breaks, Lunchs, Registration Reception, Exhibitor Reception and Poster Reception
NOTE: Guests do not have access to the Technical Sessions!
|
Guest Registration Options |
Fee |
Reception Guest Badge |
$125 |
Conference Guest Badge |
$275 |
Registration for Technical Attendees, Students, and Guests, is handled exclusively online
We cannot accept checks as a payment option
https://see-mapld.regfox.com/seemapld-2022-attendee-registration
For questions, reservation assistance, or to make changes, contact:
Teresa Farris
Teresa.farris@archon-llc.com
719-964-3617
All meals and evening functions are included in the Attendee registration fee
|
|
Exhibitor-Specific Registration Details
|
The 2022 SEE/MAPLD Exhibits are now open! The exhibit cost is $2300 which includes One (1) Complimentary Technical Registration and Two (2) Exhibitor Only badges. Additional Exhibitor Only badges are available for $275.00 and are limited to Three (3) per exhibit
The six-foot exhibit space includes a six-foot skirted table and two chairs. NOTE: this is a table top only exhibit! There is not room for a 10-foot exhibit booth!
All SEE/MAPLD exhibitors will receive free WiFi in the exhibit area!
Tentative set-up, exhibit hours and tear down are:
Set-up: Tuesday, May 17, 7:15 am– 9:15 am
Hours: Tuesday, May 17, 9:30 am – 8:00 pm with morning and afternoon
breaks, a buffet lunch, and an evening reception around the
exhibit tables
Wednesday, May 18, 9:30 am – 2:00 pm with a morning break and
buffet, with exhibitor raffles, around the exhibit tables
Tear down: Wednesday, May 18 after 2:00 pm
https://see-mapld.regfox.com/seemapld-2022-exhibitor-registration
https://see-mapld.regfox.com/seemapld-2022-booth-staff
|
Registration Options |
Fee |
Exhibitor Booth |
$2300 |
Additional Exhibitor-Only Badges |
$275 |
|
Hotel Reservation
|
Please refer to our Hotel Information page to reserve your room for the SEE/MAPLD Workshop
|
The Workshop Block of Hotel Reservations for the
2022 SEE/MAPLD Workshop at the La Jolla, CA Marriott is closed.
Please contact Teresa.farris@archon-llc.com for assistance
Local visitor information for La Jolla, CA and the San Diego area
Marriott LaJolla local Arrangement and Transportation Information
All Things La Jolla at LaJolla.com
Discover La Jolla at SanDiego.org
How to get to the San Diego Marriott La Jolla via Metropolitan Transit System
There are two easy ways to get to between the airport and MTS services. First, there's the Route 992 bus which stops right outside of baggage claim at both terminals. It only takes 15 minutes to get to/from Santa Fe Depot in Downtown San Diego, which connects with all major transit options, including three Trolley lines, three Rapid bus lines, the COASTER, and Amtrak. To get to the airport, there's a convenient stop at Kettner Blvd. and W. Broadway (in front of Starbucks), which is across the street from Santa Fe Depot and all connecting transit services. Service on the 992 is every 15 minutes for most of the day, 7 days a week. One-way fares are just $2.50 ($1.25 for Seniors, Disabled, Medicare Recipients and Youth). There are also Ticket Machines at the Airport near Information Centers and at the Santa Fe Depot and America Plaza Trolley stations where you can buy a PRONTO card and add value to take trips all during your stay in San Diego. You can also download the PRONTO mobile app in advance and load money to your account to use for your whole trip!
Airport Shuttle
There's also a free airport shuttle from the Old Town Transit Center. It's call the San Diego Flyer and it picks up and drops off passengers on Pacific Highway at the west side of the Transit Center. It operates approximately every 20-30 minutes, seven days a week. Pick up and drop-offs are timed to meet the first and last Trolley, Coasters, Amtrack trains, and MTS busses with the first pick up at 4:45 a.m. and the last pick up/drop off at 12:30 a.m. This is a service for transit riders only. There is NO OVERNIGHT PARKING at the Old Town Transit Center. For more information on this service, please visit the san.org website and its public transportation page.
2. Blue Line Trolley System
The trolley also provides an excellent way of exploring San Diego.
Previous SEE Symposium and SEE/MAPLD Home Pages:
2011,
2012,
2013,
2014,
2015,
2016,
2017,
2018,
2019,
2020,
2021
|